The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2008

Filed:

Nov. 14, 2007
Applicant:

Satoshi Kazama, Tokyo, JP;

Inventor:

Satoshi Kazama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring method for electromagnetic field intensity capable of easily and accurately measuring, with a compact and simple facility, each of the electric field component and the magnetic field component of an electromagnetic field formed in space is to be provided. By simultaneously measuring output currents Oand Ofrom two ends of a measuring probeand an output current R from a reference signal probe, the magnitudes of each of the output currents Oand Oand the phase difference of each of the output currents Oand Ofrom the output current R are measured, on the basis of the measurements the electric field component current generated from the electric field and the magnetic field component current generated from the magnetic field upon the measuring probeare calculated, and on the basis of the calculated results the electric field intensity and the magnetic field intensity are figured out.


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