The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Nov. 01, 2006
Ralf Engelmann, Jena, DE;
Joerg-michael Funk, Jena, DE;
Joerg Steinert, Jena, DE;
Bernhard Zimmermann, Jena, DE;
Stefan Wilhelm, Jena, DE;
Joerg Engel, Weida, DE;
Ulrich Meisel, Jena, DE;
Ralf Engelmann, Jena, DE;
Joerg-Michael Funk, Jena, DE;
Joerg Steinert, Jena, DE;
Bernhard Zimmermann, Jena, DE;
Stefan Wilhelm, Jena, DE;
Joerg Engel, Weida, DE;
Ulrich Meisel, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.