The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Apr. 18, 2003
Kevin T. Schomacker, Maynard, MA (US);
John A. Flanagan, Holbrook, MA (US);
Rolf B. Saager, Rochester, NY (US);
Alex Zelenchuk, Stoughton, MA (US);
Thomas M. Meese, Brookline, MA (US);
Kevin T. Schomacker, Maynard, MA (US);
John A. Flanagan, Holbrook, MA (US);
Rolf B. Saager, Rochester, NY (US);
Alex Zelenchuk, Stoughton, MA (US);
Thomas M. Meese, Brookline, MA (US);
Other;
Abstract
The invention provides methods for calibrating spectral data acquisition systems. These calibration methods produce spectral data sufficiently accurate for use in tissue classification algorithms. The invention improves the accuracy of spectral-based tissue classification schemes, in part, by properly accounting for spatial variations, instrument-to-instrument variations, and patient-to-patient variations in the acquisition of spectral data from tissue samples. Effects that are accounted for include, for example, stray light effects, electronic background effects, variation in light energy delivered to a tissue sample, spatial heterogeneities of the illumination source, chromatic aberrations of the scanning optics, variation in wavelength response of the collection optics, and efficiency of the collection optics.