The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Nov. 01, 2005
Hiroki Kenmochi, Tokyo, JP;
Hiroki Kenmochi, Tokyo, JP;
Tanita Corporation, Tokyo, JP;
Abstract
Disclosed is a digital measurement apparatus including data capture means operable to continuously capture digital data about a target measurement item, validity determination means operable to compare the captured data with a reference value so as to determine whether all of the captured data are valid, and measurement-value calculation means operable, when all of the captured data are determined to be valid, to calculate a measurement value in accordance with the valid data, which is characterized by further comprising reference-value change means operable to change the reference value. The digital measurement apparatus of the present invention makes it possible to perform a speedy measurement.