The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Nov. 06, 2003
Xiang Sean Zhou, Plainsboro, NJ (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
Alok Gupta, Bryn Mawr, PA (US);
Visvanathan Ramesh, Plainsboro, NJ (US);
Bhavani Duggirala, Bellevue, WA (US);
Diane Paine, Redmond, WA (US);
Xiang Sean Zhou, Plainsboro, NJ (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
Alok Gupta, Bryn Mawr, PA (US);
Visvanathan Ramesh, Plainsboro, NJ (US);
Bhavani Duggirala, Bellevue, WA (US);
Diane Paine, Redmond, WA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A system and method for providing decision support to a physician during a medical examination is disclosed. Data is received from a sensor representing a particular medical measurement. The received data includes image data. The received data and context data is analyzed with respect to one or more sets of training models. Probability values for the particular medical measurement and other measurements to be taken are derived based on the analysis and based on identified classes. The received image data is compared with training images. Distance values are determined between the received image data and the training images, and the training images are associated with the identified classes. Absolute value feature sensitivity scores are derived for the particular medical measurement and other measurements to be taken based on the analysis. The probability values, distance values and absolute value feature sensitivity scores are outputted to the user.