The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7457726 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 25, 2008

Filed:

Aug. 08, 2005
Applicants:

Tien Q. Nguyen, San Diego, CA (US);

Lewis Neal Cohen, San Diego, CA (US);

Frederick Wales Price, Carlsbad, CA (US);

Kenneth Canullas Sinsuan, Chula Vista, CA (US);

Theodore Jon Myers, San Diego, CA (US);

Robert W. Boesel, San Diego, CA (US);

Inventors:

Tien Q. Nguyen, San Diego, CA (US);

Lewis Neal Cohen, San Diego, CA (US);

Frederick Wales Price, Carlsbad, CA (US);

Kenneth Canullas Sinsuan, Chula Vista, CA (US);

Theodore Jon Myers, San Diego, CA (US);

Robert W. Boesel, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for obtaining processor diagnostic data. The method can include receiving a instruction, enabling write access of an output stream to a diagnostic memory, writing to the diagnostic memory at a first frequency, and reading from the diagnostic memory at a second frequency where the first frequency is greater than the second frequency.


Find Patent Forward Citations

Nguyen, Tien. (2008). System and method for selectively obtaining processor diagnostic data (U.S. Patent No. 7457726). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7457726

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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