The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Mar. 01, 2006
Hui Zhu, Redmond, WA (US);
Chris L. Barber, Redmond, WA (US);
Ryan B. Beegle, Bothell, WA (US);
Jeffrey S. Piira, Duvall, WA (US);
Hui Zhu, Redmond, WA (US);
Chris L. Barber, Redmond, WA (US);
Ryan B. Beegle, Bothell, WA (US);
Jeffrey S. Piira, Duvall, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods are disclosed for providing software performance testing. The results of a test may be determined valid if the test reached a defined test criteria after performing N number of iterations. If the test has not reached the defined test criteria and if N is less than a maximum value, one may be added to N and additional iteration of the test may be performed until the test reaches the defined test criteria or until N reaches the maximum value. If the test reaches the defined test criteria after any additional iteration of the test before N reaches the maximum value, the results of the test may be deemed valid. Moreover, if the test reached the defined test criteria with an outlier removed from the results, the results of the test may be deemed valid. Otherwise, the results of the test may be deemed invalid.