The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Jul. 28, 2005
Roland Finkler, Erlangen, DE;
Hans-georg Köpken, Erlangen, DE;
Roland Finkler, Erlangen, DE;
Hans-Georg Köpken, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Two sensors scan a measuring scale, which can be displaced in relation to the sensors and comprises a plurality of equidistant measuring gradation, and deliver corresponding measuring signals. The measuring signals are periodic during a uniform relative displacement of the measuring scale, essentially sinusoidal and essentially phase-shifted by 90° in relation to one another. They have an essentially identical amplitude and a base frequency that corresponds to the relative displacement of the measuring scale. During a delivery period of measuring signals, the measuring scale carries out a relative displacement through one measuring gradation. Corrected signals are determined from the measuring signals using correction values. A signal of the position of the measuring scale in relation to the sensors is determined in turn using said correction signals. Fourier coefficients are determined in relation to the base frequency for the corrected signals or for at least one supplementary signal that is derived from the corrected signals, said coefficients being used in turn to update the correction values. Said correction values contain two shift correction values at least one amplitude correction value and at least one phase correction value for the measuring signals, or part of said values, in addition to at least one correction value for at least one higher frequency wave of the measuring signals.