The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Dec. 20, 2005
Applicants:
Shuliang Zhang, Miami, FL (US);
Min Zheng, Pembroke Pines, FL (US);
Dongqing Lin, Fargo, ND (US);
Ziling Huo, Miami, FL (US);
Inventors:
Shuliang Zhang, Miami, FL (US);
Min Zheng, Pembroke Pines, FL (US);
Dongqing Lin, Fargo, ND (US);
Ziling Huo, Miami, FL (US);
Assignee:
Beckman Coulter, Inc., Fullerton, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods consistent with embodiments of the present invention provide a method for the measurement and analysis of particle counts in flow cytometry and hematology instruments. In some methods for the measurement and analysis of particle counts, a corrected histogram of particle distributions is calculated and used to obtain an accurate count of particles and an accurate measurement of other particle parameters.