The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Dec. 05, 2006
Applicants:
Jose DE LA Torre-bueno, Encinitas, CA (US);
Peter Salamon, San Diego, CA (US);
Inventors:
Jose de la Torre-Bueno, Encinitas, CA (US);
Peter Salamon, San Diego, CA (US);
Assignee:
Carl Zeiss MicroImaging AIS, Inc., Thornwood, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
The apparatus and method of the invention provide for assigning coordinates to samples in an array. The method is based on a hierarchical pattern matching to a local lattice structure that is used as a template. Starting from the best local match, the pattern is expanded hierarchically to encompass the entire array.