The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Jun. 19, 2004
Michael Lindner, Leutenbach, DE;
Bernd Schmidtke, Gerlingen, DE;
Michael Lindner, Leutenbach, DE;
Bernd Schmidtke, Gerlingen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An optical measuring system for detecting geometric data of surfaces of at least one object is described, comprising a beam delivery section, a probe system which is connected to the latter and has a plurality of probe outputs for output of a particular measuring beam to an assigned particular surface location and recording the light reflected back by the surface, and having a downstream analyzer unit for determining the geometric data on the basis of light reflected back by the surface locations. A very accurate and mechanically robust determination of surface geometric data, e.g., diameter and roundness of a bore, is achieved by designing the probe system having the probe outputs in such a manner that the relative position of the probe system having the probe outputs positioned in fixed relationship to one another is also determinable in relation to the object(s) at least with regard to several relevant degrees of freedom, in addition to and simultaneously with the determination of the geometric data of the surface(s).