The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Aug. 03, 2005
Matthew J. Everett, Livermore, CA (US);
Yan Zhou, Pleasanton, CA (US);
Jochen M. M. Horn, San Francisco, CA (US);
Keith O'hara, Pleasanton, CA (US);
James P. Foley, Fremont, CA (US);
Matthew J. Everett, Livermore, CA (US);
Yan Zhou, Pleasanton, CA (US);
Jochen M. M. Horn, San Francisco, CA (US);
Keith O'Hara, Pleasanton, CA (US);
James P. Foley, Fremont, CA (US);
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Abstract
A compact conical diffraction Littrow spectrometer is disclosed. The distortion of the conically diffracted spectral component beams is compensated and as a result, the diffracted spectral beams can still be focused into a substantially straight line to shine onto a detector array. A spectral domain optical coherence tomography (SD-OCT) system incorporating a Littrow spectrometer or a spectrometer having one or more shared focusing element(s) and an SD-OCT system incorporating a spectrometer that is substantially polarization independent are also disclosed.