The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Mar. 23, 2006
Gert Koest, Hannover, DE;
Gert Koest, Hannover, DE;
Oculus Optikgeraete GmbH, Wetzlar Dutenhofen, DE;
Abstract
The invention relates to a measuring device () for measuring the refraction properties of optical lenses (), especially spectacle glasses, comprising a measuring light grid () for producing a plurality of light beams () which are deflected by the lens () as a result of refraction of light, and comprising a measuring light detector () on which the deflected light beams are projected and are there recorded electronically, and comprising an evaluation device in which the refraction properties of the lens () are determined from the measurement signals of the measuring light detector (), wherein a screen () comprising a plurality of light passage openings () is arranged between the lens () to be studied and the measuring light detector (), wherein the light beam () produced by the measuring light grid () and deflected at the lens () by refection of light is projected through the various light passage openings () of the screen () along separate ray paths onto the measuring light detector ().