The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Sep. 06, 2005
Applicants:

Wen-chih Tai, Taipei Hsien, TW;

Ming-tsung Ho, Taipei Hsien, TW;

Chia-lin Liu, Tai-Chung Hsien, TW;

Chi-neng MO, Tao-Yuan Hsien, TW;

Inventors:

Wen-Chih Tai, Taipei Hsien, TW;

Ming-Tsung Ho, Taipei Hsien, TW;

Chia-Lin Liu, Tai-Chung Hsien, TW;

Chi-Neng Mo, Tao-Yuan Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 3/36 (2006.01); H04N 9/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A convergence calibration method for a display includes generating a test pattern of similar width with respect to a sensor and expanding the area of the test pattern from one side of the sensor until the whole sensor is illuminated. During the process of expanding the test pattern, the sensor continues to measure signals from the test patterns. Based on the maximum energy measured by the sensor, a digital judgment is performed for calculating convergence parameters.


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