The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2008
Filed:
Apr. 07, 2005
Gentaro Ishihara, Yokohama, JP;
Tohru Mori, Yokohama, JP;
Gentaro Ishihara, Yokohama, JP;
Tohru Mori, Yokohama, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A measurement device is provided for measuring a predetermined physical quantity which is contained in the measurement signal over a predetermined measurement range which relates to a specific property for the physical quantity according to the measurement signal which is obtained from an object for measurement so as to display the measurement result as an image in a measurement display which comprises a display range setting section which sets the measurement range, a measurement display generating section which generates the measurement display by using the measurement result in a display range which is set by the measurement range setting section among the measurement result which is measured over the measurement range which is set by the measurement range setting section, and a display section which displays the measurement display which is generated by the measurement display generating section. By doing this, it is possible to enhance an operability of the measurement device by varying the display range of the measurement result freely without changing the measurement scale.