The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Jul. 18, 2006
Applicants:

Nobuyasu Kanekawa, Hitachi, JP;

Shoji Sasaki, Hitachinaka, JP;

Katsuya Oyama, Hitachinaka, JP;

Tomonobu Koseki, Hitachinaka, JP;

Inventors:

Nobuyasu Kanekawa, Hitachi, JP;

Shoji Sasaki, Hitachinaka, JP;

Katsuya Oyama, Hitachinaka, JP;

Tomonobu Koseki, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02P 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A small-sized and low-cost phase detection circuit which has improved noise immunity. The phase detection circuit comprises a multiplier for multiplying an input signal by a reference signal and outputting a first signal, an integration circuit for integrating the first signal and outputting a second signal, a phase estimation circuit for estimating phase information based on the second signal, and a reference signal generation circuit for generating the reference signal based on the estimated phase information. Since the phase is detected based on information representing an entire waveform, the influence of local noise can be diluted and noise immunity can be improved.


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