The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Feb. 02, 2005
Applicants:

Douglas B. Cameron, Wellesley, MA (US);

David B. Wheeler, Lunenburg, MA (US);

Quan Shi, Westford, MA (US);

Raanan A. Miller, Chestnut Hill, MA (US);

Erkinjon G. Nazarov, Lexington, MA (US);

John A. Wright, Billerica, MA (US);

Inventors:

Douglas B. Cameron, Wellesley, MA (US);

David B. Wheeler, Lunenburg, MA (US);

Quan Shi, Westford, MA (US);

Raanan A. Miller, Chestnut Hill, MA (US);

Erkinjon G. Nazarov, Lexington, MA (US);

John A. Wright, Billerica, MA (US);

Assignee:

Sionex Corporation, Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); B01D 59/44 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, in some embodiments to compact GC-DMS systems and methods, and techniques for correcting nonlinear characteristics in an ion mobility based analyzer.


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