The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Aug. 25, 2005
Applicants:

Jack A. Zeineh, Fullerton, CA (US);

Rui-tao Dong, Mission Viejo, CA (US);

Inventors:

Jack A. Zeineh, Fullerton, CA (US);

Rui-Tao Dong, Mission Viejo, CA (US);

Assignee:

Carl Zeiss MicroImaging AIS, Inc., Thornwood, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for creating a digital, virtual slide having optimum image quality characteristics. Multiple regions of a physical slide are identified as well as at least two focus z-positions z, and zEach region of the physical slide is scanned (imaged) at the first z position, so as to produce a first set of digital images of each defined region. Each region of the physical slide is also scanned (imaged) at the second z position, so as to produce a second set of digital images of each defined region. Each image of each set is evaluated against a focus quality metric and, for each region, either the first or second image, corresponding to that region, is selected that exhibits a focus quality metric corresponding to a desired focus quality. These images are then merged into a digital virtual slide. Additional focus z-positions may be included, and the multiple z-positions may be scanned seriatim, sequentially, and/or in overlapping fashion.


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