The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Dec. 30, 2004
Thomas Gaudette, Jamaica Plain, MA (US);
Loren Dean, Natick, MA (US);
Greg Taillefer, Wrentham, MA (US);
Thomas Gaudette, Jamaica Plain, MA (US);
Loren Dean, Natick, MA (US);
Greg Taillefer, Wrentham, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A method, system and computer program product is disclosed for conducting a test in a distributed fashion in a test environment. A host or client may define a test for testing units under test to evaluate the parameters and characteristics of the units under test. The host or client can distribute at least a portion of the test to a remote instrument that includes a worker. The worker enables the instrument to perform at least portion of the test defined in the host or client. The instrument conduct the at least a portion of the test and may provide the results of the at least a portion of the test for the host or client. As such, the present invention allows the use of multiple resources on a network to conduct the test in a distributed fashion.