The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Nov. 08, 2005
Anthony R. Bonaccio, Shelburne, VT (US);
Allen P. Haar, State College, PA (US);
Joseph A. Iadanza, Hinesburg, VT (US);
Douglas W. Stout, Milton, VT (US);
Ivan L. Wemple, Shelburne, VT (US);
Anthony R. Bonaccio, Shelburne, VT (US);
Allen P. Haar, State College, PA (US);
Joseph A. Iadanza, Hinesburg, VT (US);
Douglas W. Stout, Milton, VT (US);
Ivan L. Wemple, Shelburne, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.