The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2008

Filed:

Nov. 22, 2004
Applicants:

Robert H. Yi, San Jose, CA (US);

Brenton A. Baugh, Palo Alto, CA (US);

James H. Williams, Walnut Creek, CA (US);

Robert E. Wilson, Palo Alto, CA (US);

Richard A. Ruh, Monte Sereno, CA (US);

Inventors:

Robert H. Yi, San Jose, CA (US);

Brenton A. Baugh, Palo Alto, CA (US);

James H. Williams, Walnut Creek, CA (US);

Robert E. Wilson, Palo Alto, CA (US);

Richard A. Ruh, Monte Sereno, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/26 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optoelectronic assembly in which one or more beam paths are to be aligned with a corresponding number of active optical elements, the cooperation between flexible alignment features and fixed alignment features achieves elastic averaging so as to provide the target accuracy. By averaging dimensional and positional errors over a large number of localized couplings of the flexible and fixed alignment features, elastic averaging provides the same accuracy as the more costly and complex kinematic alignment techniques.


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