The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Jan. 31, 2007
Joachim Baumann, München, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Joachim Baumann, München, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A focus-detector arrangement of an X-ray apparatus is disclosed, for generating projective or tomographic phase contrast recordings of a subject. In at least one embodiment, least one grating of a focus-detector arrangement includes, at least partially, a macroscopically homogeneous medium which, when excited by an energy source, assumes a periodic structure/standing wave field that leads to beam splitting and the formation of an interference pattern when the X-ray beam passes through.