The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Jul. 29, 2005
Fang-fang Yin, Chapel Hill, NC (US);
Fang-Fang Yin, Chapel Hill, NC (US);
Other;
Abstract
Systems and methods include coordinated (KV) and megaelectronvolt (MV) computerized tomography (CT) imaging. KV and MV data are combined using a normalization process in order to generate CT images. The resulting CT images can include an improved signal to noise ratio in comparison to CT images generated using either KV or MV imaging alone. The coordinated KV and MV imaging process may be accomplished in significantly less time than using KV or MV imaging alone. This time savings has advantages in treatment verification. The MV projections are optionally generated using MV x-rays configured for x-ray treatment. In these cases the combined projections will reflect the treatment volume.