The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7453933 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 18, 2008

Filed:

May. 04, 2001
Applicants:

Daniel R. Jeske, Monmouth, NJ (US);

Pantelis Monogioudis, Randolph, NJ (US);

Kiran M. Rege, Monmouth, NJ (US);

Ashwin Sampath, Somerset, NJ (US);

Inventors:

Daniel R. Jeske, Monmouth, NJ (US);

Pantelis Monogioudis, Randolph, NJ (US);

Kiran M. Rege, Monmouth, NJ (US);

Ashwin Sampath, Somerset, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04B 17/00 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

In the method of estimating a signal-to-interference+noise ratio (SINR), either the polarities or bit values of a plurality of received data symbol samples are estimated. Then an SINR estimate is generated based on the plurality of received data symbol samples and the estimated polarities or bit values of the plurality of received data symbol samples such that the SINR estimate is not substantially dependent on the polarities or a bit value of the plurality of received data symbol samples.


Find Patent Forward Citations

Loading…