The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2008

Filed:

Sep. 26, 2003
Applicants:

Jussi Vepsäläinen, Helsinki, FI;

Miikka Hämäläinen, Espoo, FI;

Inventors:

Jussi Vepsäläinen, Helsinki, FI;

Miikka Hämäläinen, Espoo, FI;

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2006.01); H04B 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An RF transceiver includes an Envelope Restoration (ER) transmitter (TX) and a receiver (RX). A method includes providing the TX with a programmable delay element in at least one of an AM path and a PM path; making an RF connection between an output of the TX and an input of the RX; and when receiving a signal through the RF connection, determining a delay value for use in programming the programmable delay element. The method includes measuring an effect on a parameter of a delay mismatch between the AM path and the PM path for use in determining the delay value. Adjacent Channel Leakage Ratio (ACLR); Own-Channel Power (OCP) or Bit Error Ratio (BER) may be measured in this regard. When measuring ACLR, delay is adjusted to minimize ACLR; when measuring OCP, delay is adjusted to maximize OCP; and when measuring BER, delay is adjusted to minimize BER.


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