The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Sep. 27, 2004
Volker Leimbach, Ludwigshafen, DE;
Reiner Rygiel, Altrip, DE;
Volker Leimbach, Ludwigshafen, DE;
Reiner Rygiel, Altrip, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A 4Pi microscope provided with an interferometer wherein two lenses () are arranged in such a way that they are opposite to each other on different sides of a sample plane (); also comprising an optical element () which is used to inject illuminating light () into the interferometer and/or used to discharge detection light () from the interferometer and to deflect a detection beam path, containing a reflecting means () which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.