The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Feb. 24, 2006
Applicants:
Andres M. Cardenas-valencia, Tampa, FL (US);
Eric T. Steimle, St. Petersburg, FL (US);
Robert H. Byrne, St. Petersburg, FL (US);
Melynda Calves, Riverview, FL (US);
Inventors:
Andres M. Cardenas-Valencia, Tampa, FL (US);
Eric T. Steimle, St. Petersburg, FL (US);
Robert H. Byrne, St. Petersburg, FL (US);
Melynda Calves, Riverview, FL (US);
Assignee:
University of South Florida, Tampa, FL (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method are herein disclosed which utilize a ratio based on a varied angle of incidence of light on an optical fiber analysis system. By calculating the ration of light incident on the sample element, variations in the system parameters which can provide deleterious effects are obviated.