The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2008

Filed:

Mar. 17, 2004
Applicants:

Seiji Tawaraya, Tokyo, JP;

Tomonobu Sumino, Tokyo, JP;

Shinji Hayashi, Tokyo, JP;

Inventors:

Seiji Tawaraya, Tokyo, JP;

Tomonobu Sumino, Tokyo, JP;

Shinji Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1339 (2006.01);
U.S. Cl.
CPC ...
Abstract

A principal object of the present invention is to provide a substrate for a liquid crystal display not undergoing mura called gravity defect because the amount of deformation in a small load region is large and having a uniformity of the panel and an adequate recovery factor against a local load. In order to achieve the aforementioned object, the present invention provides the substrate for a liquid crystal display comprises at least a transparent substrate and a columnar spacer formed on the transparent substrate. The substrate is characterized in that the amount of initial deformation A of the spacer measured by a predetermined measurement method is 0.04 μm or more and the amount of plastic deformation B is 0.7 μm or less.


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