The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Sep. 27, 2006
Naoki Isogai, Nishio, JP;
Naoki Isogai, Nishio, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An eye refractive power measurement apparatus by which an examiner can properly check reliability of a measurement result while time and effort of the examiner are saved. The eye refractive power measurement apparatus for measuring eye refractive power of an examinee's eye has a measurement optical system for projecting a measurement target onto a fundus of the eye to pick up a fundus reflection image by a two-dimensional image-pickup element, a storing device which stores the picked-up fundus reflection image as a measurement image, a display device, a measurement condition judging device which makes a judgment as to whether or not the stored measurement image satisfies a predetermined measurement condition, and a first display control device which controls the display device to display the stored measurement image when the measurement condition judging device judges that the measurement condition is not satisfied.