The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Jul. 05, 2005
Masatoshi Kuwajima, Kanagawa, JP;
Toshihiko Okano, Kanagawa, JP;
Masatoshi Kuwajima, Kanagawa, JP;
Toshihiko Okano, Kanagawa, JP;
The Yokohama Rubber Co., Ltd., Tokyo, JP;
Abstract
A method of evaluating contact characteristics of an object having a roughness includes setting geometric shape data for the roughness; creating a roughness model and a structure model that comes in contact with the roughness, based on the geometric shape data set; making the roughness model and the structure model come in contact with each other; acquiring a physical amount occurring at least one of a contact region of the roughness model and a contact region of the structure model; and obtaining an evaluation value for evaluating a real contact state in the contact region between the roughness model and the structure model, from the physical amount acquired.