The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Apr. 18, 2002
Takashi Watanabe, Kokubunji, JP;
Takashi Endo, Musashimurayama, JP;
Masahiro Kaminaga, Sakado, JP;
Kunihiko Nakada, Koganei, JP;
Yuuichirou Nariyoshi, Kodaira, JP;
Chiaki Tanimoto, Tsukuba, JP;
Takashi Watanabe, Kokubunji, JP;
Takashi Endo, Musashimurayama, JP;
Masahiro Kaminaga, Sakado, JP;
Kunihiko Nakada, Koganei, JP;
Yuuichirou Nariyoshi, Kodaira, JP;
Chiaki Tanimoto, Tsukuba, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi ULSI Systems Co., Ltd., Tokyo, JP;
Abstract
A malfunction detection system is provided that can continue or terminate processing appropriately even if a malfunction occurs in an information processing unit. In this regard, the information processing unit receives branch direction information, carries out a conditional branch depending on the branch direction information, and performs an applicable operation on data I. At this time, the information processing unit performs an applicable operation on data J, other than the operated data I, in the conditional branch path and outputs the result for examination, thereby enabling validation of the conditional branch.