The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Jun. 19, 2006
Applicants:

Weilin Wang, San Diego, CA (US);

Michael Nova, Del Mar Mesa, CA (US);

Donald Gillies, San Diego, CA (US);

Inventors:

Weilin Wang, San Diego, CA (US);

Michael Nova, Del Mar Mesa, CA (US);

Donald Gillies, San Diego, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for providing a boundary scan test of a wired or wireless network having a plurality of network nodes are presented. The system includes a test station communicatively coupled with the network. The test station creates a MAC layer scan test route sequence that includes each link in the network and is independent of the routing mechanism and protocol used for the network. The test station also creates a test agent that is configured to traverse each link in the scan test route sequence. The test agent is then deployed on the network and information about a link is reported back to the test station after the test agent examines the link. The scan test route sequence can be created by sending out a series of broadcast messages from one or more nodes in the network, sequentially applying a network tour to cover the entire network, or performing a depth first search on the entire network.


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