The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Nov. 24, 2003
Manish Gupta, Yorktown Heights, NY (US);
Jose E. Moreira, Yorktown Heights, NY (US);
Adam J. Oliner, Cheshire, CT (US);
Ramendra K. Sahoo, Mohegan Lake, NY (US);
Manish Gupta, Yorktown Heights, NY (US);
Jose E. Moreira, Yorktown Heights, NY (US);
Adam J. Oliner, Cheshire, CT (US);
Ramendra K. Sahoo, Mohegan Lake, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A hybrid method of predicting the occurrence of future critical events in a computer cluster having a series of nodes records system performance parameters and the occurrence of past critical events. A data filter filters the logged to data to eliminate redundancies and decrease the data storage requirements of the system. Time-series models and rule based classification schemes are used to associate various system parameters with the past occurrence of critical events and predict the occurrence of future critical events. Ongoing processing jobs are migrated to nodes for which no critical events are predicted and future jobs are routed to more robust nodes.