The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Mar. 15, 2004
Applicants:

Neil S. Feiereisel, Cedar Park, TX (US);

Craig M. Conway, Leander, TX (US);

Inventors:

Neil S. Feiereisel, Cedar Park, TX (US);

Craig M. Conway, Leander, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a system comprises a delay determining unit that may be operable to determine a relative delay between the first signal provided by the first source and the second signal provided by the second source, based upon a travel path of the first signal and a travel path of the second signal. In addition, a delay circuit, comprised within the waveform generator, may be configured to be programmed to delay output of the first signal to output the first signal at a predetermined position with respect to output of the second signal, based on the determined relative delay. More specifically, in one embodiment, the delay circuit may be configured to be automatically programmed to add the relative delay to the output of the first signal to automatically align the output of the first signal with respect to the output of the second signal.


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