The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Jul. 13, 2006
Kazuhiko Hosomi, Tachikawa, JP;
Hiroji Yamada, Kanagawa, 220-1020, JP;
Toshio Katsuyama, Oume-city, Tokyo, 198-0087, JP;
Yasuhiko Arakawa, Kawasaki-city, Kanagawa, 215-0021, JP;
Toshihiko Fukamachi, Kokubunji, JP;
Kazuhiko Hosomi, Tachikawa, JP;
Hiroji Yamada, Kanagawa, 220-1020, JP;
Toshio Katsuyama, Oume-city, Tokyo, 198-0087, JP;
Yasuhiko Arakawa, Kawasaki-city, Kanagawa, 215-0021, JP;
Toshihiko Fukamachi, Kokubunji, JP;
Hitachi, Ltd., Tokyo, JP;
Other;
Abstract
The present invention provides an ultra-mini and low cost refractive index measuring device applicable to biochemical measurements of an extremely minute amount of a sample. The refractive index measuring device uses a photonic crystal without any requirement of an external spectrograph or the like. The micro sensor device according to the present invention includes a light source emitting light with a single wavelength, a microcavity in which a resonant wavelength varies depending on a position thereof. A refractive index of a material to be measured is measured based on positional information by detecting a transmitting position of light changing in response to a change of a refractive index of the measured material. The micro sensor device according to the present invention enables measurement of a refractive index of a material to be measured without using a large-scale spectrograph.