The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Jul. 21, 2004
Adam Morell, Lund, SE;
Adam Morell, Lund, SE;
Cellavision AB, Lund, SE;
Abstract
A method is disclosed for determining a sought object contour in a digital microscope image, which includes a plurality of image elements and reproduces a biological material. The method includes assigning edge values to at least a first subset of the image elements in the image; assigning values of a first gradient vector component whose values each includes a first linear combination of edge values of some surrounding image elements to at least a second subset of the image elements in the image; assigning values of a second gradient vector component whose values each include a second linear combination of edge values of some surrounding image elements to at least a third subset of the image elements in the image; and calculating an estimate of the sought object contour based upon values of the first and second gradient vector components.