The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Jun. 22, 2004
Sam M. Daniel, Tempe, AZ (US);
Peter Z. Lo, Lake Forest, CA (US);
Harshawardhan M. Wabgaonkar, Lake Forest, CA (US);
Sam M. Daniel, Tempe, AZ (US);
Peter Z. Lo, Lake Forest, CA (US);
Harshawardhan M. Wabgaonkar, Lake Forest, CA (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method for comparing a first print image having a first set of minutiae to a second print image having a second set of minutiae, wherein at least a second subset of minutiae from the second set is mated to a first subset of minutiae from the first set, the method that includes the steps of: selecting () a first pair of minutiae from the first subset and a second pair of corresponding mated minutiae from the second subset; generating () a first segment based on the first pair of minutiae and a second segment based on the second pair of minutiae; generating () a first cross-section profile based on the first segment and a second cross-section profile based on the second segment; and computing () at least one similarity measure that is indicative of the similarity between the first cross-section profile and the second cross-section profile.