The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Jul. 08, 2005
Applicants:
Frank Eisenkraemer, Biebertal, DE;
Ralf Krueger, Butzbach/Griedel, DE;
Christian Schulz, Wetzlar-Naunheim, DE;
Inventors:
Frank Eisenkraemer, Biebertal, DE;
Ralf Krueger, Butzbach/Griedel, DE;
Christian Schulz, Wetzlar-Naunheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope () is disclosed, having a revolving nosepiece () on which are mounted multiple objectives. The objectives () comprise multiple components). A light-intensity-reducing layer () is applied onto at least one component of an objective. The light-intensity-reducing layer () is configured in such a way that for each objective introduced into the illumination beam path, the brightness behind it is of the same magnitude.