The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Dec. 25, 2002
Yoshiyuki Takizawa, Wako, JP;
Yoshiyuki Takahashi, Wako, JP;
Hirohiko Shimizu, Wako, JP;
Chiko Otani, Wako, JP;
Toshikazu Ebisuzaki, Wako, JP;
Yoshiyuki Takizawa, Wako, JP;
Yoshiyuki Takahashi, Wako, JP;
Hirohiko Shimizu, Wako, JP;
Chiko Otani, Wako, JP;
Toshikazu Ebisuzaki, Wako, JP;
Riken, Saitama, JP;
Abstract
The light of a broad energy band can be observed by reflecting the light of the broad energy band, for example, the light from the visible light region to the x-ray region at a high reflectance respectively, by a composite telescope including a normal incidence optical system and an oblique incidence optical system. A broadband telescope comprise an oblique incidence optical system unit in which the light is obliquely incident on a surface part for reflecting the incident light, a normal incidence optical system unit in which the light is substantially vertically incident on a surface part for reflecting the incident light, and an analyzer for spectrum analysis of the light reflected by the surface part of the obliquely incidence optical system unit and the light reflected by the surface part of the normal incidence optical system unit.