The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Apr. 12, 2005
Applicants:

Jae-hwan Yoo, Yongsin-si, KR;

Hyeong-chae Kim, Yongsin-si, KR;

Inventors:

Jae-hwan Yoo, Yongsin-si, KR;

Hyeong-chae Kim, Yongsin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an optical scanning device and a method for detecting a synchronization signal. In the optical scanning device, a beam incident on a scanning area of an object's surface to be scanned and a beam incident on a synchronization signal detector are emitted by a light source but deflected from different deflecting surfaces of a beam deflector.


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