The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Mar. 31, 2005
Noboru Uehara, Aichi, JP;
Yuichi Takushima, Tokyo, JP;
Yasuyuki Ozeki, Tokyo, JP;
Yoichi Hirota, Tokyo, JP;
Noboru Uehara, Aichi, JP;
Yuichi Takushima, Tokyo, JP;
Yasuyuki Ozeki, Tokyo, JP;
Yoichi Hirota, Tokyo, JP;
Santec Corporation, Aichi, JP;
Abstract
An optical pulse evaluation device and an in-service optical pulse evaluation device is disclosed which are capable of characteristics evaluation of an optical pulse itself or a sample launched therein in a relatively high bit-rate region. The optical pulse evaluation device evaluates a pulse waveform expressing an optical intensity of the optical pulse, an instantaneous frequency of the optical pulse, or a modulated light prepared by modulating the optical pulse in a light source end. The optical pulse evaluation device also observes a waveform change after a known optical pulse is passed through a device such as an optical fiber to evaluate a waveform deterioration or a compensation behavior caused by the device. The in-service optical pulse evaluation device is capable of measuring a wavelength dispersion in an optical communication.