The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Aug. 18, 2004
Joseph Zyss, Sceaux, FR;
Timothee Pol Jean Toury, Tournes, FR;
Joseph Zyss, Sceaux, FR;
Timothee Pol Jean Toury, Tournes, FR;
Centre National de la Reccherche Scientifique CNRS, Paris Cedex, FR;
Ecole Normale Superieure de Cachan, Cachan Cedex, FR;
Abstract
The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile