The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Mar. 22, 2007
Applicants:

Kenneth Sartor, Melbourne, FL (US);

Josef Allen, Melbourne, FL (US);

Emile Ganthier, Palm Bay, FL (US);

Bernard S. Gilbert, Palm Bay, FL (US);

Gnana Bhaskar Tenali, Melbourne, FL (US);

Inventors:

Kenneth Sartor, Melbourne, FL (US);

Josef Allen, Melbourne, FL (US);

Emile Ganthier, Palm Bay, FL (US);

Bernard S. Gilbert, Palm Bay, FL (US);

Gnana Bhaskar Tenali, Melbourne, FL (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer system for processing interferometric synthetic aperture radar (SAR) images includes a database for storing SAR images to be processed, and a processor for processing interferometric SAR images from the database. The processing includes receiving first and second complex SAR data sets of a same scene, with the second complex SAR data set being offset in phase with respect to the first complex SAR data set. Each complex SAR data set includes a plurality of pixels. An interferogram is formed based on the first and second complex SAR data sets for providing a phase difference therebetween. A complex anisotropic diffusion algorithm is applied to the interferogram. The interferogram includes a real and an imaginary part for each pixel. A shock filter is applied to the interferogram. The processing further includes performing a two-dimensional variational phase unwrapping on the interferogram after application of the shock filter.


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