The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
May. 02, 2006
Applicants:
Ryan Lee Bunch, Greensboro, NC (US);
Alexander Wayne Hietala, Phoenix, AZ (US);
Scott Robert Humphreys, Greensboro, NC (US);
Inventors:
Ryan Lee Bunch, Greensboro, NC (US);
Alexander Wayne Hietala, Phoenix, AZ (US);
Scott Robert Humphreys, Greensboro, NC (US);
Assignee:
RF Micro Devices, Inc., Greensboro, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/085 (2006.01); H03L 7/089 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
Abstract
A linearization system is provided for a Fractional-N Offset Phase Locked Loop (FN-OPLL) in a frequency or phase modulation system. In general, the linearization system processes a modulation signal to provide a linearized modulation signal to a fractional-N divider in a reference path of the FN-OPLL such that a frequency or phase modulation component at the output of the FN-OPLL is substantially linear with respect to the modulation signal.