The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Jun. 12, 2006
Applicants:

Patrick Ian Oden, McKinney, TX (US);

Jason Michael Neidrich, Fairview, TX (US);

Inventors:

Patrick Ian Oden, McKinney, TX (US);

Jason Michael Neidrich, Fairview, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for detecting and imaging radiation. A preferred embodiment comprises a substrate with electronic circuitry to detect changes in a transduction signal, an intermediate conductive layer disposed above and electrically connected to the electronic circuitry, and a lower separation layer with a high coefficient of thermal resistance that partially separates the intermediate conductive layer from the electronic circuitry. The preferred embodiment also includes a top layer disposed above the intermediate conductive layer and an absorptive layer overlying the top layer, with the absorptive layer being electrically connected to the intermediate conductive layer. The absorptive layer produces a transduction signal that is proportional to an amount of radiation incident on the absorptive layer. The vertical fabrication of the radiation sensor allows for sensor arrays with a good fill factor, permitting the creation of sensor arrays with high resolution while maintaining low costs.


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