The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Apr. 28, 2006
Applicants:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

James Frank Caruba, Bartlett, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Anthony P. Delmedico, Niles, IL (US);

Inventors:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

James Frank Caruba, Bartlett, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Anthony P. DelMedico, Niles, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for acquiring total uniformity for a scintillation imaging apparatus are provided. A generic energy (Z) map is first obtained. The generic Zmap is then corrected for linearity by use of a dot pattern. The listmode data is used to construct an energy histogram matrix. A twin Zmap is then obtained by optimizing the lower and upper boundaries of the energy window for each pixel in relation to the average energy over the Center Field of View.


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