The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Jan. 09, 2004
Applicants:

Masahiko Hirano, Hamamatsu, JP;

Masafumi Oshiro, Hamamatsu, JP;

Atsushi Miyawaki, Wako, JP;

Inventors:

Masahiko Hirano, Hamamatsu, JP;

Masafumi Oshiro, Hamamatsu, JP;

Atsushi Miyawaki, Wako, JP;

Assignees:

Riken, Wako-shi, Saitama, JP;

Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzer for measuring an FRET (fluorescence resonance energy transfer) efficiency of a specimen containing a donor and an acceptor. The analyzer has an illuminator, an optical system, a detector and a calculator. The illuminator emits light for donor excitation and acceptor bleaching. The detector detects fluorescence from the specimen. The calculator calculates the FRET efficiency using the output of the detector. The detector independently detects the fluorescence in wavelength regions. One of the regions has a larger overlap with the fluorescence spectrum of the acceptor than with that of the donor.


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