The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Mar. 12, 2007
Applicant:
Aanand Esterberg, Seattle, WA (US);
Inventor:
Aanand Esterberg, Seattle, WA (US);
Assignee:
IMPINJ, Inc., Seattle, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 7/00 (2006.01); H04Q 5/22 (2006.01); G08B 13/14 (2006.01); G06K 7/00 (2006.01); G06K 19/00 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
RFID readers, RFID tags, software, and methods decode a signal received in an RFID system. From received data, a decoder determines a number of possible test series for the output. In one embodiment, the decoder uses a memory of a previous sample to derive a subsequent sample in the test series, so as to ensure that all the test series are valid. A metric is then computed for how well each test series fits the received data. The metrics are compared to select for output the test series with the best fit. In a further embodiment, at least one of the metrics is further used to determine if a collision were present.