The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Jun. 16, 2004
Applicants:
Yingquan Wu, Urbana, IL (US);
Gregory L. Silvus, Boulder, CO (US);
Thomas V. Souvignier, Longmont, CO (US);
Inventors:
Yingquan Wu, Urbana, IL (US);
Gregory L. Silvus, Boulder, CO (US);
Thomas V. Souvignier, Longmont, CO (US);
Assignee:
Seagate Technology, Inc., Scotts Valley, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method or apparatus that can form and test a data block variant by flipping a selected potentially bad bit that is consecutive with 1 or 2 sequences of several potentially good bits of a received block. The variant correctability test is optionally repeated several times before receiving another data block, in the event of ECC failures, each repetition using a different block variant.