The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2008
Filed:
Jun. 05, 2007
Douglas H. Bradley, Austin, TX (US);
Jonathan J. Dement, Austin, TX (US);
Sang H. Dhong, Austin, TX (US);
Brian Flachs, Georgetown, TX (US);
Gilles Gervais, Austin, TX (US);
Yoichi Nishino, Tokyo, JP;
Douglas H. Bradley, Austin, TX (US);
Jonathan J. DeMent, Austin, TX (US);
Sang H. Dhong, Austin, TX (US);
Brian Flachs, Georgetown, TX (US);
Gilles Gervais, Austin, TX (US);
Yoichi Nishino, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for sorting processor chips based on a thermal design point are provided. With the system and method, for each processor chip, a high power workload is run on the processor chip to determine a voltage regulator module (VRM) load line. Thereafter, a thermal design point (TDP) workload is applied to the processor chip and the voltage is varied until a performance of the processor chip falls on the VRM load line. At this point, the power input to the processor chip is measured and used to sort, or bin, the processor chip. The various workloads applied have a constant frequency. From this sorting of processor chips, high speed processors that require less voltage to achieve a desired frequency and low current processors that drain less current while running at a desired frequency may be identified.